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ARTICLE 2025 Vol 4 · No 11 EN c930ee868134

RAMAN SPECTROSCOPIC ANALYSIS OF TUNGSTEN SILICIDE (WSI2) PHASE FORMATION AND LATTICE STRESS IN P-TYPE SILICON.

РАМАНОВСКИЙ СПЕКТРОСКОПИЧЕСКИЙ АНАЛИЗ ФАЗООБРАЗОВАНИЯ СИЛИЦИДА ВОЛЬФРАМА (WSI2) И НАПРЯЖЕНИЙ РЕШЁТКИ В КРЕМНИИ P-ТИПА. | P-TIPLI KREMNIYDA VOLFRAM SILITSIDI (WSI2) FAZASINING HOSIL BO'LISHI VA PANJARA KUCHLANISHINING RAMAN SPEKTROSKOPIK TAHLILI.

Research Focus International Scientific Journal, 4(11), 16–24 · ISSN 2181-3833

Annotatsiya

In this study, the effect of tungsten (W) incorporation on the compositional and structural properties of p-type single-crystal silicon (p-Si) samples via high-temperature (1573 K, 5 hours) thermal diffusion was investigated. The properties of the samples were analyzed using Raman scattering spectroscopy. Raman spectroscopy analysis confirmed a decrease in the intensity of the main silicon LO peak in the p-Si sample, as well as the appearance of new, sharp peaks at frequencies of ~244 cm⁻¹ and ~429 cm⁻¹. These changes indicate the formation of a new stable phase – tungsten silicide (WSi2) – on the silicon surface. Furthermore, the shift of the 2TA peak center to a higher frequency (~319 cm⁻¹) indicated the emergence of strong compressive mechanical stresses in the lattice.

Kalit so‘zlar

single-crystal silicon (p-Si)tungsten (W)thermal diffusionRaman spectroscopyresistivitytungsten silicide (WSi2)phonon bands (TALA2TO)

Iqtibos keltirish

Sh.B. Utamuradova; Sh.Kh. Daliev; J.J. Khamdamov; Y.Z. Mardiyev (2025). RAMAN SPECTROSCOPIC ANALYSIS OF TUNGSTEN SILICIDE (WSI2) PHASE FORMATION AND LATTICE STRESS IN P-TYPE SILICON.. Research Focus International Scientific Journal, 4(11), 16–24. https://doi.org/10.66073/researchfocus.v4i11.1824

Identifikator
https://rf-library.uz/article/c930ee868134/raman-spectroscopic-analysis-of-tungsten-silicide-wsi2-phase-formation-and
DOI
10.66073/researchfocus.v4i11.1824
Litsenziya
Copyright (c) 2026 Research Focus International Scientific Journal
Nashriyot
LLC Ilm-fan va innovatsiyalar akademiyasi
Repozitoriyga qo‘shildi
2026-08-07